Equipment
For our research we make use of the following equipment:
Analytics
- Extreme-Resolution Field Emission SEM JEOL JSM-7800F Prime with Oxford Aztec EDX-System and Oxford INCA WDX-System
- Secondary Ion Mass Spectrometer, SIMS: ION-TOF TOF-SIMS IV
- Scanning Electron Microscope LEO/Zeiss 1450VP, with Oxford INCA EDX system
- Interference Microscope Veeco NT1100
- Optical Microscope Leica DM-RM, with CCD camera and high temperature chamber for temperatures up to 900°C at variable atmospheres
Sample characterization
- X-ray diffractometer STOE STADI-P
- X-ray diffractometer STOE Theta-Theta with Buehler high temperature chamber HDK 1.4 for temperatures up to 1400°C at variable atmospheres
- Thermogravimetry Setaram SETSYS
- In situ-Impedance spectroscopy Schlumberger-Solatron + HP
- In situ DC conductivity in 4 contact and Van Der Pauw geometry
- Gas phase mass spectrometer
- In situ sample environment for X-ray absorption spectroscopy at temperatures up to 1300°C and variable reactive gas atmospheres
Synthesis
-
Pulsed Laser Deposition, PLD: SURFACE PLD-Workstation
- Various high temperature furnaces, up to 1600°C, some at variable atmospheres
- Electron beam furnace
- Hydraulic press
- Ball mill
- Particle size separator
- Single crystal growth Bridgman at temperatures up to 900°C
- Chemical laboratory
Sample preparation and metallography
- Cross Section Polisher JEOL IB-19500CP
- Diamond wire saw
- Various polishing and grinding machines
- Diamond saw
Radiotracer laboratory
- Multi channel gamma detector, Oxford
- Polishing machine
- Various high temperature furnaces, up to 1500°C, with variable atmospheres